Optycal thickness measuring system

OPTYLAYER – represents the latest measuring solution available on the market to optically measure the thickness of a sample with a complex structure. Layers of different material generate an optical reflection due to the difference of the refractive index. Optical Head collects all the reflections that are mixed together with embedded optics.
The resulting optical signal will contain information about the position of each reflection. The processing of the optical signals allow the reconstruction of an A-scan profile (Intensity of reflection vs. Position).
The analysis of the A-Scan allows extraction of information about the individual layers.