- In-line measurement and identification of surface defects
- Very high frequency analysis of single scans
- Diode LED light source
- List of alarms associated with the time and the position in which it was detected
Defex
Optoelectronic device for the in-line measurement and identification of surface defects
DEFEX is the latest generation optoelectronic device for the in-line measurement and identification of surface defects, such as protrusions, throttling, abrasions, local insulation lack, partial detachments or flakes.
Processes:
